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SM ISO690:2012 SERGEEV, Sergei, YOVU, M., ENACHI, Mihail. Binary superimposed gratings formed by e-beam recording in amorphous AsS films. In: Journal of Nanoelectronics and Optoelectronics, 2014, vol. 9, pp. 291-294. ISSN 1555-130X. DOI: https://doi.org/10.1166/jno.2014.1583 |
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Journal of Nanoelectronics and Optoelectronics | |||||||
Volumul 9 / 2014 / ISSN 1555-130X | |||||||
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DOI:https://doi.org/10.1166/jno.2014.1583 | |||||||
CZU: 621.38+538.9 | |||||||
Pag. 291-294 | |||||||
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Binary unidirectional superimposed diffraction gratings with grating periods of 0.9 μm and 1 μm were formed in amorphous AsS films by e-beam recording. The influence of recording sequence of index superimposed gratings on their diffraction efficiency was evidenced. Enhancement of diffraction efficiencies of index superimposed gratings as compared to single gratings was revealed. Relief structures of superimposed gratings were fabricated by chemical etching. The surface relief modulation was studied by atomic force microscope. A beat period of 9 μm for relief complex structure was observed. The highest depth of relief modulation was about 70-80 μm |
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Cuvinte-cheie diffraction efficiency, e-beam recording, Relief Structure, Superimposed Gratings |
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DataCite XML Export
<?xml version='1.0' encoding='utf-8'?> <resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'> <identifier identifierType='DOI'>10.1166/jno.2014.1583</identifier> <creators> <creator> <creatorName>Sergheev, S.A.</creatorName> <affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation> </creator> <creator> <creatorName>Iovu, M.S.</creatorName> <affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation> </creator> <creator> <creatorName>Enachi, M.A.</creatorName> <affiliation>National Center for Materials Study and Testing, Technical University of Moldova, Moldova, Republica</affiliation> </creator> </creators> <titles> <title xml:lang='en'>Binary superimposed gratings formed by e-beam recording in amorphous AsS films</title> </titles> <publisher>Instrumentul Bibliometric National</publisher> <publicationYear>2014</publicationYear> <relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>1555-130X</relatedIdentifier> <subjects> <subject>diffraction efficiency</subject> <subject>e-beam recording</subject> <subject>Relief Structure</subject> <subject>Superimposed Gratings</subject> <subject schemeURI='http://udcdata.info/' subjectScheme='UDC'>621.38+538.9</subject> </subjects> <dates> <date dateType='Issued'>2014-04-01</date> </dates> <resourceType resourceTypeGeneral='Text'>Journal article</resourceType> <descriptions> <description xml:lang='en' descriptionType='Abstract'><p>Binary unidirectional superimposed diffraction gratings with grating periods of 0.9 μm and 1 μm were formed in amorphous AsS films by e-beam recording. The influence of recording sequence of index superimposed gratings on their diffraction efficiency was evidenced. Enhancement of diffraction efficiencies of index superimposed gratings as compared to single gratings was revealed. Relief structures of superimposed gratings were fabricated by chemical etching. The surface relief modulation was studied by atomic force microscope. A beat period of 9 μm for relief complex structure was observed. The highest depth of relief modulation was about 70-80 μm</p></description> </descriptions> <formats> <format>uri</format> </formats> </resource>