Afiliat la Universitatea „Politehnica“, Timisoara
Numeric modeling and analytical solution of ionizing irradiation induced charge in MOSFET structure oxide |
Rusanovschi Vitalie , Avram Adrian Adrian |
Symposium on Electronics and Telecommunications ISETC 2014 |
Ediția 11. 2015. New Jersey. Institute of Electrical and Electronics Engineers Inc.. 0-0. |
Disponibil online 2 June, 2023 |
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