Conţinutul numărului revistei |
Articolul precedent |
Articolul urmator |
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SM ISO690:2012 YOVU, M., VASILIEV, Ion, SHPOTYUK, Oleh. Ageing phenomena in thin amorphous AsxSe100-x films. In: Journal of Optoelectronics and Advanced Materials, 2009, vol. 11, pp. 2011-2018. ISSN 1454-4164. |
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Journal of Optoelectronics and Advanced Materials | ||||||
Volumul 11 / 2009 / ISSN 1454-4164 | ||||||
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Pag. 2011-2018 | ||||||
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The quasi-static capacitance of amorphous As10Se90 thin films was studied in cycles of heating and cooling near the glass transition temperature Tg=343 K. Features in the capacitance behavior such as: non-exponential relaxation, non-Arrhenius character of time relaxations, hysteresis of temperature dependence, physical ageing - are revealed near this temperature. It was accepted, that the capacitance measurements allow finding the glass transition temperature Tg in amorphous As10Se90 thin films which is accompanied by freezing of some electric dipoles; these dipoles are forming from neighboring pairs of charged defects such as D+ and D-. |
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Cuvinte-cheie Amorphous films, capacitance, chalcogenide glasses, Glass transition temperature |
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