Transient photocurrent in α-As2Se3 thin films with optical bias
Close
Articolul precedent
Articolul urmator
128 0
SM ISO690:2012
IOVU, Maria, HAREA, Diana, VASILIEV, Ion, KOLOMEYKO, Eduard, YOVU, M.. Transient photocurrent in α-As2Se3 thin films with optical bias. In: Proceedings of SPIE - The International Society for Optical Engineering, Ed. 2, 24-26 noiembrie 2004, Bucharest. Bellingham, Washington: Cavallioti, 2005, Ediţia 2, Vol.5972, pp. 1-8. ISBN 9739463916. ISSN 0277-786X. DOI: https://doi.org/10.1117/12.639445
EXPORT metadate:
Google Scholar
Crossref
CERIF

DataCite
Dublin Core
Proceedings of SPIE - The International Society for Optical Engineering
Ediţia 2, Vol.5972, 2005
Conferința "Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies"
2, Bucharest, Romania, 24-26 noiembrie 2004

Transient photocurrent in α-As2Se3 thin films with optical bias

DOI:https://doi.org/10.1117/12.639445

Pag. 1-8

Iovu Maria, Harea Diana, Vasiliev Ion, Kolomeyko Eduard, Yovu M.
 
Institute of Applied Physics, Academy of Sciences of Moldova
 
 
Disponibil în IBN: 26 ianuarie 2024


Rezumat

Relaxation of pulsed photocurrents under optical bias is studied in amorphous films of glassy alloys As2Se3:Snx (x=0 to 3.5 at.%) by the time-of-flight technique and steepness band-to-band light illumination. In frame of multiple-trapping model it is shown that by adding tin to the glass former As2Se3, the hole drift mobility is strongly increased and hamper the recombination. The kinetics of the long-term photocurrent decay can be described by stretched exponential function. The dispersion parameter α, which can be deduced from the time dependence of the photocurrent Iph (t) ∞ exp[-(τ/τ) α] and, is about 0.47 for undoped samples, and 0.35 for tin-containing samples. The obtained results indicate the variation in occupation of deep localized centers. For the investigated samples, the width of distribution of the deep traps is approximately kT/α∼50-70 meV.

Cuvinte-cheie
Engineering controlled terms Amorphous films, functions, glass, Photocurrents Engineering uncontrolled terms Deep localized centers, Optical bias, Photocurrent decay, Transient photocurrent Engineering main heading Thin films

Crossref XML Export

<?xml version='1.0' encoding='utf-8'?>
<doi_batch version='4.3.7' xmlns='http://www.crossref.org/schema/4.3.7' xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xsi:schemaLocation='http://www.crossref.org/schema/4.3.7 http://www.crossref.org/schema/deposit/crossref4.3.7.xsd'>
<head>
<doi_batch_id>ibn-195865</doi_batch_id>
<timestamp>1717104169</timestamp>
<depositor>
<depositor_name>Information Society Development Instiute, Republic of Moldova</depositor_name>
<email_address>[email protected]</email_address>
</depositor>
</head>
<body>
<collection>
<collection_metadata>
<full_title>Proceedings of SPIE - The International Society for Optical Engineering</full_title>
<issn media_type='print'>0277-786X</issn>
</collection_metadata>
<collection_issue>
<publication_date media_type='print'>
<year>2005</year>
</publication_date>
<isbn>9789739463911</isbn>
</collection_issue>
<collection_article publication_type='full_text'><titles>
<title>Transient photocurrent in &alpha;-As2Se3 thin films with optical bias</title>
</titles>
<contributors>
<person_name sequence='first' contributor_role='author'>
<given_name>Maria</given_name>
<surname>Iovu</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Diana</given_name>
<surname>Harea</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Ion</given_name>
<surname>Vasiliev</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Eduard</given_name>
<surname>Colomeico</surname>
</person_name>
<person_name sequence='additional' contributor_role='author'>
<given_name>Mihail</given_name>
<surname>Iovu</surname>
</person_name>
</contributors>
<publication_date media_type='print'>
<year>2005</year>
</publication_date>
<pages>
<first_page>1</first_page>
<last_page>8</last_page>
</pages>
<doi_data>
<doi>10.1117/12.639445</doi>
<resource>http://www.crossref.org/</resource>
</doi_data>
</collection_article>
</collection>
</body>
</doi_batch>