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| Articolul urmator |
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 SM ISO690:2012BAKERENKOV, A., SOLOMATI, Anatoly, PERSHENKOV, Vyacheslav, NAGOVITSINA, Olga. An automatic equipment for nanoelectronic devices electrical characteristics measurement. In: Nanotechnologies and Biomedical Engineering, Ed. 2, 18-20 aprilie 2013, Chișinău. Technical University of Moldova, 2013, Editia 2, pp. 124-127. ISBN 978-9975-62-343-8.. |
| EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
| Nanotechnologies and Biomedical Engineering Editia 2, 2013 |
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Conferința "International Conference on Nanotechnologies and Biomedical Engineering" 2, Chișinău, Moldova, 18-20 aprilie 2013 | ||||||
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| Pag. 124-127 | ||||||
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| Rezumat | ||||||
An automatic equipment for semiconductor device voltage-current characteristic measurement was described. Diode current sensor for current measurements was used and sensor calibration technique was presented. It provides relative accuracy 1% in wide current range (10-2A..10-10A). |
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| Cuvinte-cheie measuring systems, current sensor, voltage-current characteristic, nanoelectronic devices, semiconductor, integrated circuits |
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