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 SM ISO690:2012PRISLOPSKI, Sergey, GAPONENCO, Sergey, MONAICO, Eduard, SERGENTU, Vladimir, TIGINYANU, Ion. Polarized Retroreflection from Nanoporous III–V Semiconductors. In: Semiconductors, 2018, vol. 52, pp. 2068-2069. ISSN 1063-7826. DOI: https://doi.org/10.1134/S1063782618160248 |
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  Semiconductors |
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| Volumul 52 / 2018 / ISSN 1063-7826 | ||||||
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| DOI:https://doi.org/10.1134/S1063782618160248 | ||||||
| Pag. 2068-2069 | ||||||
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Retroreflected light with strong linear polarization coinciding with that of the incident beams is detected from strongly absorbing nanoporous III–V semiconductors. Because of high polarization of retroreflected waves we assume that coherent backscattering is the underlying physical mechanism of this phenomenon. |
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