Articolul precedent |
Articolul urmator |
256 1 |
Ultima descărcare din IBN: 2021-12-01 15:04 |
SM ISO690:2012 POPA, Mihail. Cercetarea proprietăților electrice ale straturilor electrice ale straturilor subțiri de ZnSxSe1-x,. In: Ştiinţa în Nordul Republicii Moldova: realizări, probleme, perspective, 25-26 septembrie 2015, Bălți. Balti, Republic of Moldova: Tipogr. „Indigou Color”, 2015, Ediția 1, pp. 17-20. ISBN 978-9975-3054-5-7. |
EXPORT metadate: Google Scholar Crossref CERIF DataCite Dublin Core |
Ştiinţa în Nordul Republicii Moldova: realizări, probleme, perspective Ediția 1, 2015 |
||||||
Conferința "Ştiinţa în Nordul Republicii Moldova: realizări, probleme, perspective" Bălți, Moldova, 25-26 septembrie 2015 | ||||||
|
||||||
Pag. 17-20 | ||||||
|
||||||
Descarcă PDF | ||||||
Rezumat | ||||||
ZnSxSe1-x thin films (x = 0, 0.2, 0.4, 0.5, 0.6, 0.8, 1.0) were prepared from thermal evaporation method in quasi closed volume with a thickness between 0.2 and 1.0 m. Thermal activation energy determined from the dependencies lnσ = f (103/T) type were between 0.43 eV 1.89 eV (for T > 300 K) and 0,132-0,403 eV ( for T < 300K). Explaining the mechanism of electron transport in polycrystalline ZnSxSe1-x thin films is based on the Efros-Shklovskii and Mott models. We have studied the current-voltage characteristics of In - ZnSxSe1-x - In type systems and the obtained results were represented in the Schottky coordinates which have been shown to be linear. By extrapolating the linear portion of curve lnJ = f(U1/2) for U 0, was determined the height of the barrier potential at the metalsemiconductor interface. The values found for the 0 accord well with those found for the ZnSe and ZnS crystals. |
||||||
|