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 SM ISO690:2012MAMEDOV, G., GODZHAEV, E., MAGERRAMOV, A., ZEINALOV, Sh.. Atomic Force Microscopy Studies of the Surface Relief of Composites of High Density Polyethylene and Additives of TlGaSe2 and the Analysis of Their Dielectric Properties
. In: Surface Engineering and Applied Electrochemistry, 2011, nr. 6(47), pp. 565-569. ISSN 1068-3755. |
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  Surface Engineering and Applied Electrochemistry |
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| Numărul 6(47) / 2011 / ISSN 1068-3755 /ISSNe 1934-8002 | ||||||
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| Pag. 565-569 | ||||||
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In this work, we describe a technique for the preparation of composites of high density polyethylene and additives of TlGaSe2, the atomic force microscopy studies of their surface relief, and the analysis of their dielectric properties.
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