Experimental Studies of Cation Anion Deficient Nd1 – xSrxMnO3 – y(x = 0.45) Films with Various Thicknesses
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HOHLOV, V.. Experimental Studies of Cation Anion Deficient Nd1 – xSrxMnO3 – y(x = 0.45) Films with Various Thicknesses. In: Surface Engineering and Applied Electrochemistry. 2010, nr. 2(46), pp. 144-148. ISSN 1068-3755.
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Surface Engineering and Applied Electrochemistry
Numărul 2(46) / 2010 / ISSN 1068-3755 /ISSNe 1934-8002

Experimental Studies of Cation Anion Deficient Nd1 – xSrxMnO3 – y(x = 0.45) Films with Various Thicknesses

Pag. 144-148

Hohlov V.
 
 
Disponibil în IBN: 14 decembrie 2013


Rezumat

The magnetic and electroconducting properties of Nd1 – xSrxMnO3 – y films with various thicknesses are studied. It is shown that all the films exhibit considerably high conductivity at a temperature of 300 K and that they are not a paramagnetic insulator as should be the case according to the phase diagram of this compound. The temperature dependence of the resistance exhibits a semiconductor behavior with decreasing temperature and has a maximum Rmax at the temperature Tmax being significantly different from the Curie point. A negative magnetic moment is observed in all the studied films at high temperatures. The possible causes of this phenomenon are discussed.