This paper describe structural and morphology of a new composite materials with distinct chemical and physical properties that were not observed in the individual components and can be exploited for optoelectronic applications. Copper- and zinc- phthalocyanine (Cu, Zn)Pc are  typical p-type organic semiconductors widely used in organic field effect transistors, organic light emitting diodes, and solar cells. Semiconducting materials with high performance can be formed by the incorporation of two different organic materials. In this work, we have used both  (Cu, Zn)Pc and the polyepoxypropylcarbazol (PEPC) for obtaining new composite materials. Concentrations of 10 mg/ml of  (Cu, Zn)Pc and 5 mg/ml PEPC plus 0.06 g of tetrahydrofuran (TNF) of solution were prepared separately in n,n-dimethylformamide (DMF) and then mixed. A blend mixture of (Cu, Zn)Pc and PEPC with different proportions were used for the  preparation of thin films on the  glass substrates  with dimensions of 2×2 cm.  The blended mixture of  (Cu, Zn)Pc and PEPC was dropcasted onto the glass substrate and spin-coated at 1000 rpm, room temperature. After the preparation, samples were annealed in the furnace in the temperature range of 50–60°С during 30 min in the presence of H2 atmosphere. Characterizations were performed via Shimadzu UV-VIS spectrophotometer, field emission scanning electron microscope - energy dispersive X-ray spectroscope (FESEM-EDX) (JSM 7600-F, JEOL), and  X-ray diffraction (XRD) using a BrukerAXS D8 Advance diffractometer (CuKa radiation, 40 mA, 40 kV). The elements such as carbon (C), oxygen (O), N (nitrogen), copper (Cu) and zinc (Zn) detected by the energy-dispersive X-ray spectroscopy (EDX) analysis  support the presence of (Cu, Zn) Pc-PEPC composite, while other detected elements of sodium (Na), alluminium (Al), silicon (Si), etc. correspond to the dissolution solvents and sample substrate, respectively. XRD analysis revealed in the CuPc-PEPC composite thin films after annealing only beta phase of the CuPc but in non-annealed reveal and other phases. XRD of the pure CuPc thin film reveals the alpha-form of phthalocyanine.   The XRD pattern of the PEPC thin film exhibits a broader maximum indicating amorphous structure.  UV-VIS spectrum of the pure  CuPc thin films  has indicated  two bands, one with the peak located at 345 nm which assigned as Soret band (B band) and  another with two peaks sitiuated at 637 nm and 716 nm which assigned as Q band. The Soret band is a characteristic of the metal phthalocyanines absorption spectrum. On the other hand, strong absorption band in the red region of the spectrum (600–750) nm with  two trapping levels around 637 nm and  716 nm is also common in metal phthalocyanine films, and is responsible for the blue colour of these materials. UV-VIS spectrum of  the pure PEPC thin film indicated a band in the (280-600) nm UV-VIS region of the spectrum  with intensive peak at about 350 nm. By incorporation of these two materials together, a broader absorption at the Q band and B bands occur. In the B band of the (Cu, Zn) Pc-PEPC composite films still appear a second peak situated at about 296 nm. In addition, a new band with peak situated at the 270 nm appear, and its position and intensity depends on the proportion of CuPc-PEPC. As results, the intensity and broadening of the bands of the (Cu, Zn) Pc-PEPC composite thin films depend on the proportion of the mixture and could be explained by  different intermolecular interactions. The absorption spectra of ZnPc-PEPC are similar to the spectra observed in CuPc-PEPC composite thin film. The investigation of the distribution of the  photosensitivity of  the (Cu, Zn)Pc-PEPC composite thin films show shift of the maximum of photosensitivity in the in near IR-region in comparison with of the CuPc thin films.