For liquid droplets of sub-micrometer dimensions, the study of wetting properties (quantified by contact angle, disjoining pressure, spreading coefficient, etc.) is possible using the relatively new technique known as Scanning Polarization Force Microscopy (SPFM). This non-contact scanning probe microscopy technique was successfully implemented in our laboratory in order to study the wetting properties of glycerol and sulfuric acid on the surface of highly oriented pyrolytic graphite (HOPG) and glycerol on aluminum film deposited on mica. An AC polarization bias of 3V at 3kHz frequency was applied between a conductive atomic force microscope tip and the substrate. The resulting polarization force was measured with high accuracy, allowing non-contact topography profile measurements of liquid micro- and nano-droplets as in the figure below. The dependence of the contact angle on micro- and nano-droplet height was determined in order to calculate the values of the spreading coefficient and the disjoining pressure between different liquids and substrates [14]. The calculated potential energies give disjoining pressure values specific to every liquid-solid substrate pair. For instance, in the case of H2SO4 on HOPG the strength of the force appears to be thirty times bigger than that for glycerol on HOPG and aluminum.   SPFM presents highly interesting applications also in investigating solid materials. Tuning between SPFM in AC or DC mode, would allow us to reveal the dielectric mapping of a surface, or to measure quantitatively the surface potential of a solid material or its dielectric constant, or to implement the contaminants detection in micro- and nano-electronics. All of these capabilities will be presented.