Investigation of Structural Features of As2S3-Se Multilayer Nanostructure by Raman Spectroscopy
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ABASHKIN, Vladimir, AKIMOVA, Elena, MESHALKIN, Alexei, PRISAKAR, Alexandr, TRIDUKH, Ghennadi, VLCEK, Miroslav, LOGHINA (BEŢ), Liudmila, VOYNAROVYCH, Ivan. Investigation of Structural Features of As2S3-Se Multilayer Nanostructure by Raman Spectroscopy . In: Электронная обработка материалов, 2016, nr. 4(52), pp. 67-73. ISSN 0013-5739.
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Электронная обработка материалов
Numărul 4(52) / 2016 / ISSN 0013-5739 /ISSNe 2345-1718

Investigation of Structural Features of As2S3-Se Multilayer Nanostructure by Raman Spectroscopy
CZU: 535.4+538.958+538.975

Pag. 67-73

Abashkin Vladimir1, Akimova Elena1, Meshalkin Alexei1, Prisakar Alexandr1, Tridukh Ghennadi1, Vlcek Miroslav2, Loghina (Beţ) Liudmila2, Voynarovych Ivan2
 
1 Institute of Applied Physics, Academy of Sciences of Moldova,
2 University of Pardubice
 
Proiecte:
 
Disponibil în IBN: 13 noiembrie 2016


Rezumat

The focus of this research is on the investigation of structural changes in the As2S3-Se multilayer nanostructure and on the examination of a relative contribution of As2S3 and Se layers to nanostructuring by measuring the Raman spectra. The formation of the As2S3-Se nanostructure by an alternate As2S3 and Se layers deposition was applied. The diffraction efficiency dependence on the exposure of a CW DPSS laser were monitored in a transmission mode of the1st order diffracted beam intensity and measured in real-time at the normal incidence of the laser diode beam (λ = 650 nm). From the comparison of these dependences for a set of samples we have chosen the multilayer nanostructure As2S3-Se with optimal recording properties meaning maximum both the value and the rate of diffraction efficiency. Our results are found to be of practical interest as they allow a significant improvement of the diffraction efficiency of the directly recorded relief gratings.

Cuvinte-cheie
chalcogenide glasses, nanostructures, Raman spectroscopy, surface grating

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<?xml version='1.0' encoding='utf-8'?>
<resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'>
<creators>
<creator>
<creatorName>Abaşkin, V.G.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Achimova, E.A.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Meşalchin, A.I.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Prisacar, A.M.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Triduh, G.M.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Vlcek, M.</creatorName>
<affiliation>University of Pardubice, Cehia</affiliation>
</creator>
<creator>
<creatorName>Loghina (Beţ), L.P.</creatorName>
<affiliation>University of Pardubice, Cehia</affiliation>
</creator>
<creator>
<creatorName>Voynarovich, I.</creatorName>
<affiliation>University of Pardubice, Cehia</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='en'>Investigation of Structural Features of As2S3-Se Multilayer Nanostructure by Raman Spectroscopy </title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2016</publicationYear>
<relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>0013-5739</relatedIdentifier>
<subjects>
<subject>chalcogenide glasses</subject>
<subject>nanostructures</subject>
<subject>Raman spectroscopy</subject>
<subject>surface grating</subject>
<subject schemeURI='http://udcdata.info/' subjectScheme='UDC'>535.4+538.958+538.975</subject>
</subjects>
<dates>
<date dateType='Issued'>2016-08-22</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Journal article</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'>The focus of this research is on the investigation of structural changes in the As2S3-Se multilayer nanostructure and on the examination of a relative contribution of As2S3 and Se layers to nanostructuring by measuring the Raman spectra. The formation of the As2S3-Se nanostructure by an alternate As2S3 and Se layers deposition was applied. The diffraction efficiency dependence on the exposure of a CW DPSS laser were monitored in a transmission mode of the1st order diffracted beam intensity and measured in real-time at the normal incidence of the laser diode beam (λ = 650 nm). From the comparison of these dependences for a set of samples we have chosen the multilayer nanostructure As2S3-Se with optimal recording properties meaning maximum both the value and the rate of diffraction efficiency. Our results are found to be of practical interest as they allow a significant improvement of the diffraction efficiency of the directly recorded relief gratings. </description>
</descriptions>
<formats>
<format>application/pdf</format>
</formats>
</resource>