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SM ISO690:2012 SHMAVONYAN, G.. Focused ion beam treatment of ZnO nanowires. In: Moldavian Journal of the Physical Sciences, 2009, nr. 2(8), pp. 201-206. ISSN 1810-648X. |
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Moldavian Journal of the Physical Sciences | ||||||
Numărul 2(8) / 2009 / ISSN 1810-648X /ISSNe 2537-6365 | ||||||
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Pag. 201-206 | ||||||
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We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub-
strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes,
surface properties and features, but seem to be all homogeneous inside. Darkish spots and
areas on the surface are easily removed by a “gentle” focused ion beam (FIB) treatment. To
unveil their deeper interior, we also applied FIB treatment. An overview of our results (SEM
images) is given in this paper.
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