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Ultima descărcare din IBN: 2023-01-30 00:23 |
Căutarea după subiecte similare conform CZU |
535.33:543.4 (6) |
Propagare. Reflecţie. Refracţie. Absorbţie. Emisie (95) |
Metode de analiză spectrală. Metode de analiză optică (65) |
SM ISO690:2012 GHIMPU, Lidia, SUMAN, Victor, RUSNAC, Dumitru, POTLOG, Tamara. Fabrication Of p-NiO/n-ZnO:Ga heterostructures for a rectifier diode and a UV photodetector via RF magnetron sputtering and spray pyrolysis synthesis. In: Moldavian Journal of the Physical Sciences, 2021, nr. 1(20), pp. 66-72. ISSN 1810-648X. DOI: https://doi.org/10.53081/mjps.2021.20-1.05 |
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Moldavian Journal of the Physical Sciences | |||||
Numărul 1(20) / 2021 / ISSN 1810-648X /ISSNe 2537-6365 | |||||
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DOI: https://doi.org/10.53081/mjps.2021.20-1.05 | |||||
CZU: 535.33:543.4 | |||||
Pag. 66-72 | |||||
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In this paper, a p–n thin film NiO/ZnO heterojunction for a rectifier diode and a UV photodetector is prepared and characterized. Nickel oxide (NiO) and gallium-doped zinc oxide (ZnO:Ga) thin films are grown by RF magnetron sputtering and spray pyrolysis techniques, respectively. The crystal structure of the thin films is studied by the X-ray diffraction (XRD) method. The transmittance and reflectance are studied by UV–VIS spectroscopy. The p–n electrical parameters are estimated from current–voltage characteristics. The effects of duration of thermal annealing at 450oC on the characteristics of the NiO/ZnO:Ga device are evaluated. The non-annealed diode shows the best rectification coefficient of 105 at ±1 V. The p–n photodetection capability is studied under UV illumination. At a reverse bias of –3 V under 365-nm UV illumination, the device shows a current intensity of ~6.2 × 10-12 A. The observed increase in the reverse current intensity by about two orders of magnitude under a UV lamp with a spectral irradiance of 10 W m-2 μ m-1 indicates a promising application in UV light detection. |
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Cuvinte-cheie RF magnetron sputtering, spray pyrolysis, UV–VIS spectroscopy, Electrical properties, pulverizare cu magnetron RF, piroliză prin pulverizare, spectroscopie UV–VIS, proprietăți electrice |
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