Transport properties of CaSi2 and Ca2Si thin films
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DERMENJI, Lazari, LISUNOV, Konstantin, GALKIN, Konstantin, GOROSHKO, Dmitry, CHUSOVITIN, Evgeniy, GALKIN, Nikolay, ARUSHANOV, Ernest. Transport properties of CaSi2 and Ca2Si thin films. In: Solid State Phenomena, 2020, nr. 312, pp. 3-8. ISSN 1012-0394. DOI: https://doi.org/10.4028/www.scientific.net/SSP.312.3
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Solid State Phenomena
Numărul 312 / 2020 / ISSN 1012-0394 /ISSNe 1662-9779

Transport properties of CaSi2 and Ca2Si thin films

DOI:https://doi.org/10.4028/www.scientific.net/SSP.312.3

Pag. 3-8

Dermenji Lazari1, Lisunov Konstantin1, Galkin Konstantin2, Goroshko Dmitry2, Chusovitin Evgeniy2, Galkin Nikolay2, Arushanov Ernest1
 
1 Institute of Applied Physics,
2 Institute of Automation and Control Processes, Far Eastern Branch of RAS
 
 
Disponibil în IBN: 25 martie 2021


Rezumat

Resistivity, ρ (T), and Hall coefficient in weak (B < 1 T) magnetic fields, R (T), are investigated in Ca2Si and CaSi2 films at temperatures T between ~ 20 − 300 K. In CaSi2, ρ (T) is typical of metals increasing with T within the whole temperature range. On the other hand, the resistivity of Ca2Si is pertinent of semiconductors. Namely, it is activated below T ~ 200 K, exhibiting different slopes of ln ρ vs. T−1 plots at lower and higher T, and a weak increase between T ~ 200 − 300 K. Both materials demonstrate a complex dependence of R (T), including a change of the sign. Transport properties above have been analyzed assuming two groups of charge carriers, electrons and holes, contributing them.

Cuvinte-cheie
Electronic transport, Hall effect, Resistivity, Silicides