Conţinutul numărului revistei |
Articolul precedent |
Articolul urmator |
286 0 |
SM ISO690:2012 DERMENJI, Lazari, LISUNOV, Konstantin, GALKIN, Konstantin, GOROSHKO, Dmitry, CHUSOVITIN, Evgeniy, GALKIN, Nikolay, ARUSHANOV, Ernest. Transport properties of CaSi2 and Ca2Si thin films. In: Solid State Phenomena, 2020, nr. 312, pp. 3-8. ISSN 1012-0394. DOI: https://doi.org/10.4028/www.scientific.net/SSP.312.3 |
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Solid State Phenomena | ||||||
Numărul 312 / 2020 / ISSN 1012-0394 /ISSNe 1662-9779 | ||||||
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DOI:https://doi.org/10.4028/www.scientific.net/SSP.312.3 | ||||||
Pag. 3-8 | ||||||
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Rezumat | ||||||
Resistivity, ρ (T), and Hall coefficient in weak (B < 1 T) magnetic fields, R (T), are investigated in Ca2Si and CaSi2 films at temperatures T between ~ 20 − 300 K. In CaSi2, ρ (T) is typical of metals increasing with T within the whole temperature range. On the other hand, the resistivity of Ca2Si is pertinent of semiconductors. Namely, it is activated below T ~ 200 K, exhibiting different slopes of ln ρ vs. T−1 plots at lower and higher T, and a weak increase between T ~ 200 − 300 K. Both materials demonstrate a complex dependence of R (T), including a change of the sign. Transport properties above have been analyzed assuming two groups of charge carriers, electrons and holes, contributing them. |
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Cuvinte-cheie Electronic transport, Hall effect, Resistivity, Silicides |
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