The basic structural, electrical, and electron paramagnetic resonance (EPR) of Mn2+ and Eu 2+ in films and structures grown by laser-assisted deposition technique LAD technique on different substrates at relatively low temperatures (T = 293-573 K) are analyzed. LAD is well-known as the method of obtaining high quality IV-VI and II-VI semiconductor thin layers and low-dimensional structures with abrupt metallurgical boundary and homogeneous impurity distribution in the layers. The electron paramagnetic resonance spectra investigations (Varian E-12 spectrometer, 3 cm wave length region, temperature range 20-300 K) were indicated to verify the crystalline quality of IV-VI layers grown by LAD, and also for studying the state of paramagnetic impurities in the lattice of these of these layers. In the layers deposited from the PbTe:Mn and PbTe:Eu targets, measurements of the EPR spectra with the orientation of the magnetic field perpendicular to the layer surface exhibited satellite lines near each HFS line (∆H ≅ 4.5 Oe), caused by superhyperfine interaction (SHFI) of Mn 2+ 3d 5 and Eu 2+ 4f 7 electrons with the nuclear moments of 125Te and 153Te in the first coordination shell. In this case the SH parameters are the next: PbTe:Mn - g = 1.9975 ± 0.0005, A = (59.9 ± 0.2)×10 -4 cm -1 , and aTe=(15.8 ± 0.2) ×10-4 cm-1, PbTe:Eu – g = 1.997510 ± 00055, b4 = (40.1 ± 0.45)×10 -4 cm -1 , b6 = (-0.63 ± 0.45)×10 -4 cm -1 , A=(27.0 ± 0.45)×10 -4 cm -1 , aTe=(11.8 ± 0.45)×10 -4 cm -1 for the 151Eu isotope, A = (11.9 ± 0.45)×10 -4 cm -1 for the 153Eu isotope, where aTe is SHFI constant. Due to the heavy overlap of the EPR lines, the value of the SHFI constant for the 153Eu isotope cold not be determined. The ratio of the HFI constants, A(151Eu)/A(153Eu) obtained from the experimental data is equal to the ratio of the nuclear magnetic moments for these isotopes. The SHFS-to-HFS line intensity ratio (ISHFS :IHFS:ISHFS) exhibited a strong dependence on the experimental conditions (UHV power level and temperature) and therefore did not always agree with the theoretical ratio 1:4:1. Distinct from the EPR spectra of Mn 2+ for PbTe:Mn films, no line broadening in the EPR spectra of PbTe:Eu was observed when the magnetic field deviated from the normal to the film surface. This can possibly be explained by a much smaller effect of residual stress, arising in the films due to the difference in lattice constant between the film and the substrate material and on the deeper europium 4f7 levels compared to the manganese 3d 5 levels.