Afișare rezultate

SM ISO690:2012

Low temperature X-Ray powder diffraction study of lead telluride doped with Yb

Nicorici Andrei1, Shklover Valery2, Todosiciuc Alexandr1

1 Institute of Electronic Engineering and Industrial Technologies, Academy of Sciences of Moldova, 2 Swiss Federal Institute of Technology in Zurich

Journal of Optoelectronics and Advanced Materials

Nr. / 2008 / ISSN 1454-4164

Disponibil online 26 February, 2024. Descarcări-0. Vizualizări-43

-----------------------------------------------------------------------------------------------------------------------------------

Characterization of core/shell structures based on CdTe and GaAs nanocrystalline layers deposited on SnO2 microwires

Ghimpu Lidia1, Ursachi Veaceslav1, Pantazi Aida Ghiulnare2, Mesterca Raluca2, Brincoveanu Oana2, Shree Sindu3, Adelung Rainer3, Tighineanu Ion1, Enăchescu Marius2

1 Institute of the Electronic Engineering and Nanotechnologies "D. Ghitu" of the Academy of Sciences of Moldova, 2 University Politehnica of Bucharest,

Superlattices and Microstructures

Nr. / 2018 / ISSN 0749-6036

Disponibil online 19 March, 2018. Descarcări-0. Vizualizări-810

-----------------------------------------------------------------------------------------------------------------------------------

10203040501005001000