Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography
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CAZAC, Veronica, MESHALKIN, Alexei, AKIMOVA, Elena, ABASHKIN, Vladimir, KATKOVNIK, Vladimir, SHEVKUNOV, Igor, CLAUS, Daniel, GIANCARLO, Pedrini. Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography. In: Applied Optics, 2018, nr. 3(57), pp. 507-513. ISSN 1559-128X. DOI: https://doi.org/10.1364/AO.57.000507
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Applied Optics
Numărul 3(57) / 2018 / ISSN 1559-128X

Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography

DOI:https://doi.org/10.1364/AO.57.000507

Pag. 507-513

Cazac Veronica1, Meshalkin Alexei1, Akimova Elena1, Abashkin Vladimir1, Katkovnik Vladimir2, Shevkunov Igor32, Claus Daniel4, Giancarlo Pedrini4
 
1 Institute of Applied Physics, Academy of Sciences of Moldova,
2 Tampere University of Technology,
3 Saint Petersburg State University,
4 Institute of Applied Optics, University of Stuttgart
 
 
Disponibil în IBN: 23 februarie 2018


Rezumat

Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As2S3−Se and thin films As2S3. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.

Cuvinte-cheie
Amorphous films, Chalcogenides, Diffraction gratings, holography, Maps, Microscopic examination, Semiconducting selenium compounds

DataCite XML Export

<?xml version='1.0' encoding='utf-8'?>
<resource xmlns:xsi='http://www.w3.org/2001/XMLSchema-instance' xmlns='http://datacite.org/schema/kernel-3' xsi:schemaLocation='http://datacite.org/schema/kernel-3 http://schema.datacite.org/meta/kernel-3/metadata.xsd'>
<identifier identifierType='DOI'>10.1364/AO.57.000507</identifier>
<creators>
<creator>
<creatorName>Cazac, V.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Meşalchin, A.I.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Achimova, E.A.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Abaşkin, V.G.</creatorName>
<affiliation>Institutul de Fizică Aplicată al AŞM, Moldova, Republica</affiliation>
</creator>
<creator>
<creatorName>Katkovnik, V.</creatorName>
<affiliation>Tampere University of Technology, Finlanda</affiliation>
</creator>
<creator>
<creatorName>Shevkunov, I.</creatorName>
<affiliation>Санкт-Петербургский государственный университет, Rusia</affiliation>
</creator>
<creator>
<creatorName>Claus, D.</creatorName>
<affiliation>Institut für Technische Optik, Universität Stuttgart, Germania</affiliation>
</creator>
<creator>
<creatorName>Giancarlo, P.</creatorName>
<affiliation>Institut für Technische Optik, Universität Stuttgart, Germania</affiliation>
</creator>
</creators>
<titles>
<title xml:lang='en'>Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography</title>
</titles>
<publisher>Instrumentul Bibliometric National</publisher>
<publicationYear>2018</publicationYear>
<relatedIdentifier relatedIdentifierType='ISSN' relationType='IsPartOf'>1559-128X</relatedIdentifier>
<subjects>
<subject>Amorphous films</subject>
<subject>Chalcogenides</subject>
<subject>Diffraction gratings</subject>
<subject>holography</subject>
<subject>Maps</subject>
<subject>Microscopic examination</subject>
<subject>Semiconducting selenium compounds</subject>
</subjects>
<dates>
<date dateType='Issued'>2018-01-20</date>
</dates>
<resourceType resourceTypeGeneral='Text'>Journal article</resourceType>
<descriptions>
<description xml:lang='en' descriptionType='Abstract'><p>Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As<sub>2</sub>S<sub>3</sub>&minus;Se and thin films As<sub>2</sub>S<sub>3</sub>. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.</p></description>
</descriptions>
<formats>
<format>uri</format>
</formats>
</resource>