Characterization of gas sensitive chalcogenide films by impedance spectroscopy
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2019-02-28 15:05
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TSIULYANU , Dumitru. Characterization of gas sensitive chalcogenide films by impedance spectroscopy . In: Microelectronics and Computer Science, Ed. 9, 19-21 octombrie 2017, Chisinau. Chișinău, Republica Moldova: Universitatea Tehnică a Moldovei, 2017, Ediția 9, p. 477. ISBN 978-9975-4264-8-0.
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Microelectronics and Computer Science
Ediția 9, 2017
Conferința "Microelectronics and Computer Science"
9, Chisinau, Moldova, 19-21 octombrie 2017

Characterization of gas sensitive chalcogenide films by impedance spectroscopy


Pag. 477-477

Tsiulyanu Dumitru
 
Technical University of Moldova
 
 
Disponibil în IBN: 1 noiembrie 2017