Aerosol Spray Deposited Wurtzite ZnMgO Alloy Films with MgO Nanocrystalline Inclusions
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MORARI, Vadim, RUSU, Emil, URSAKI, Veacheslav, NIELSCH, Kornelius, TIGINYANU, Ion. Aerosol Spray Deposited Wurtzite ZnMgO Alloy Films with MgO Nanocrystalline Inclusions. In: IFMBE Proceedings: . 5th International Conference on Nanotechnologies and Biomedical Engineering, Ed. 5, 3-5 noiembrie 2021, Chişinău. Chişinău: Pontos, 2022, Ediția 5, Vol.87, pp. 32-39. ISSN 16800737. DOI: https://doi.org/10.1007/978-3-030-92328-0_5
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IFMBE Proceedings
Ediția 5, Vol.87, 2022
Conferința "Conference on Nanotechnologies and Biomedical Engineering"
5, Chişinău, Moldova, 3-5 noiembrie 2021

Aerosol Spray Deposited Wurtzite ZnMgO Alloy Films with MgO Nanocrystalline Inclusions

DOI: https://doi.org/10.1007/978-3-030-92328-0_5

Pag. 32-39

Morari Vadim1, Rusu Emil1, Ursaki Veacheslav2, Nielsch Kornelius3, Tiginyanu Ion4
 
1 Institute of the Electronic Engineering and Nanotechnologies "D. Ghitu",
2 Technical University of Moldova,
3 Leibniz Institute for Solid State and Materials Reseach, Dresden,
4 National Center for Materials Study and Testing, Technical University of Moldova
 
Proiecte:
 
Disponibil în IBN: 29 ianuarie 2022


Rezumat

In this paper Zn1-xMgxO thin films with composition range x = 0.00–0.80 have been obtained by aerosol spray deposition method on p-Si substrates by using zinc acetate and magnesium acetate as precursors. The produced thin films were characterized by scanning electron microscopy (SEM), energy dispersive X-ray (EDX) analysis, X-ray diffraction (XRD), and optical spectroscopy. SEM images revealed uniform nanocrystalline morphology of films, but the form of nanocrystals vary with variation of the Mg content. XRD analysis suggests that the produced films contain a wurtzite Zn1-xMgxO phase in the whole chemical composition range, with cubic phase MgO nanocrystalline inclusions with mean grain size around 20 nm. The optical bandgap was found to vary from 3.4 eV to 5.2 eV with increasing the Mg content from 0 to 60%.

Cuvinte-cheie
band gap, SEM, thin films, X-ray diffraction, Zn1-xMgxO