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Articolul urmator |
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SM ISO690:2012 GRABCO, Daria, NICORICI, Valentina, BARBOS (DĂNIŢĂ), Zinaida, TOPAL, Daria, ŞIKIMAKA, Olga. Micromechanical properties and plastic deformation features of the Pb1−xYbxTe Ternary Semiconductors. In: IFMBE Proceedings: . 4th International Conference on Nanotechnologies and Biomedical Engineering, Ed. 4, 18-21 septembrie 2019, Chişinău. Switzerland: Springer Nature Switzerland AG, 2020, Ediția 4, Vol.77, pp. 149-153. ISBN 978-303031865-9. ISSN 16800737. DOI: https://doi.org/10.1007/978-3-030-31866-6_31 |
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IFMBE Proceedings Ediția 4, Vol.77, 2020 |
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Conferința "Conference on Nanotechnologies and Biomedical Engineering" 4, Chişinău, Moldova, 18-21 septembrie 2019 | |||||||
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DOI:https://doi.org/10.1007/978-3-030-31866-6_31 | |||||||
Pag. 149-153 | |||||||
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In this paper, the effect of ytterbium (Yb) impurity on the microstructure, the specificity of plastic deformation and the strength properties of PbTe crystals has been studied. The researches have been conducted on a PMT-3 microhardness tester using loads in the range (50–1000) mN. For all applied loads, the Pb1-xYbxTe (x = 0.0025; 0.0075 and 0.01 at.%) single crystals showed pronounced plasticity and very low hardness values (H = 0.35–0.39 GPa), which is characteristic of compounds containing lead. It was suggested that the deformation of Pb1−xYbxTe crystals under microindentation occurs by a dislocation mechanism with some contribution of the structure compaction in the bulk beneath the indentations. |
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Cuvinte-cheie Deformation specificity, Microhardness, Microstructure, Pb1−xYbxTe single crystals |
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